Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers
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M. Köhl | A. Roos | Charles Anderson | K. Gelin | F. Geotti-Bianchini | P. V. Nijnatten | M. Hutchins | P. Turner | P. Polato | N. Kilbey | F. Olive | R. Spragg