论文信息 - A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

A degradation monitor that allows the prediction of the light output degradation of light emitting diodes is described. This is based on the variation of the differential cathodoluminescence signal output to distinguish between "good" and "bad" devices. A corresponding method using the variation of the junction ideality factor during stressing is also described.

[1] D. Mcelfresh,et al. Categorizing light output degradation failures in LEDs using the relationship between defect revealing mechanisms responsible for electroluminescence (EL), cathodoluminescence (CL), EBIC, and reverse bias photoemission (RP) , 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.

[2] S. M. Sze. Physics of semiconductor devices /2nd edition/ , 1981 .

[3] O. Ueda. INFLUENCE OF DEFECTS ON THE DEGRADATION OF III-V OPTO-ELECTRONIC DEVICES , 1990 .

[4] J.C.H. Phang,et al. Optoelectronic material analysis and device failure analysis using SEM cathodoluminescence , 1994 .

[5] P. F. Lindquist. A New Model for Light Output Degradation of Direct Band Gap Emitters , 1980, 18th International Reliability Physics Symposium.

[6] H. Grubin. The physics of semiconductor devices , 1979, IEEE Journal of Quantum Electronics.