A Comprehensive Tool for Modeling CMOS Image-Sensor-Noise Performance

Accurate modeling of image noise is important in understanding the relative contributions of multiple-noise mechanisms in the sensing, readout, and reconstruction phases of image formation. There is a lack of high-level image-sensor system modeling tools that enable engineers to see realistic visual effects of noise and change-specific design or process parameters to quickly see the resulting effects on image quality. This paper reports a comprehensive tool, written in MATLAB, for modeling noise in CMOS image sensors and showing the effect in images. The tool uses accepted theoretical/empirical noise models with parameters from measured process-data distributions. Output images from the tool are used to demonstrate the effectiveness of this approach in determining the effects of various noise sources on image quality

[1]  Hiroaki Ohkubo,et al.  High sensitivity and no-cross-talk pixel technology for embedded CMOS image sensor , 2000 .

[2]  Roberto Costantini,et al.  Virtual sensor design , 2004, IS&T/SPIE Electronic Imaging.

[3]  R. Royall.  Statistical Evidence: A Likelihood Paradigm , 1997 .

[4]  D. Fleetwood,et al.  Random telegraph signals in small gate‐area p‐MOS transistors , 2008 .

[5]  E. J. Gumbel,et al.  Statistics of Extremes. , 1960 .

[6]  Warren J. Ewens,et al.  Likelihood: An account of the statistical concept of likelihood and its application to scientific inference. , 1973 .

[7]  J. Teugels,et al.  Statistics of Extremes , 2004 .

[8]  Mariesa L. Crow,et al.  The effect of excitation limits on voltage stability , 1995 .

[9]  J. Janesick,et al.  Scientific Charge-Coupled Devices , 2001 .

[10]  Edward R. Dowski,et al.  Noise modeling for design and simulation of computational imaging systems , 2004, SPIE Defense + Commercial Sensing.

[11]  M. W. Green,et al.  2. Handbook of the Logistic Distribution , 1991 .

[12]  A. Theuwissen,et al.  Solid-State Imaging with Charge-Coupled Devices , 1995 .

[13]  A. W. F. Edwards,et al.  Statistical Inference. (Book Reviews: Likelihood. An Account of the Statistical Concept of Likelihood and Its Application to Scientific Inference) , 1973 .

[14]  R. Fisher,et al.  Limiting forms of the frequency distribution of the largest or smallest member of a sample , 1928, Mathematical Proceedings of the Cambridge Philosophical Society.

[15]  Alain Hoffmann,et al.  Trap competition inducing R.T.S noise in saturation range in N-MOSFETs , 2005, SPIE International Symposium on Fluctuations and Noise.

[16]  Siméon-Denis Poisson.  Recherches sur la probabilité des jugements en matière criminelle et en matiére civile, précédées des règles générales du calcul des probabilités , 1837 .

[17]  H. Heijns,et al.  A low dark current double membrane poly-Si FT-technology for 2/3 inch 6M pixel CCD imagers , 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).

[18]  T. Arakawa,et al.  A 60 mW 10 b CMOS image sensor with column-to-column FPN reduction , 2000, 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).

[19]  Janne Aikio,et al.  Simulation of imaging system's performance , 2004, SPIE Optics + Photonics.

[20]  T. Antal,et al.  1/f noise and extreme value statistics. , 2001, Physical review letters.

[21]  P. Holgate.  Lognormal Distributions: Theory and Applications , 1989 .

[22]  W. Mendenhall,et al.  Statistics for engineering and the sciences , 1984 .

[23]  K. Findlater,et al.  SXGA pinned photodiode CMOS image sensor in 0.35 /spl mu/m technology , 2003, 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC..

[24]  C. Mouli,et al.  CMOS imager technology shrinks and image performance , 2004, 2004 IEEE Workshop on Microelectronics and Electron Devices.

[25]  Robert W. G. Hunt,et al.  The reproduction of colour , 1957 .

[26]  Kevin E. Spaulding,et al.  Color processing in digital cameras , 1998, IEEE Micro.

[27]  H. Wallinga,et al.  Separation of random telegraph signals from 1/f noise in MOSFETs under constant and switched bias conditions , 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

[28]  J. Leroy Folks.  Inverse Gaussian Distribution , 2004 .

[29]  Peter B. Catrysse,et al.  A simulation tool for evaluating digital camera image quality , 2003, IS&T/SPIE Electronic Imaging.

[30]  Ellen C. Carter.  The reproduction of colour, 5th edition, by R. W. G. Hunt , 1998 .