论文信息 - Scans along arbitrary directions in reciprocal space and the analysis of GaN films on SiC - 字舞流文

Scans along arbitrary directions in reciprocal space and the analysis of GaN films on SiC

M. Goorsky | M. Wojtowicz | S. Hayashi | K. Matney | B. Heying | R. Sandhu | B. Poust | R. Ho