Ultrafast structural changes measured by time-resolved X-ray diffraction

High-intensity X-ray pulses from third-generation synchrotron sources make it possible to study the temporal dynamics of rapidly evolving materials. We report a study of rapid and reversible disordering of the structure of an InSb crystal induced by an ultrashort laser pulse. A novel cross-correlation detection technique is described, which allowed us to observe rapid changes in X-ray diffraction that occur on a time-scale of less than 2 ps.