Microstructure and properties of artificial grain boundaries in epitaxial YBA2Cu3O7−δ thin films grown on [001] tilt YZrO2 bicrystals
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Z. Ivanov | D. Winkler | O. Lebedev | A. Tzalenchuk | E. Olsson | A. Vasiliev | A. Vasiliev | N. Kiselev | E. Stepantsov | J. Alarco