Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

A sensitivity characterization of a Xilinx Artix-7 field programmable gate array (FPGA) against 14.2-MeV neutrons is presented. The content of the internal static random access memories (SRAMs) and flip-flops was downloaded in a PC and compared with a golden version of it. Flipped cells were identified and classified as cells of the configuration RAM, block RAM (BRAM), or flip-flops. Single bit upsets (SBUs) and multiple cell upsets (MCUs) with multiplicities ranging from 2 to 8 were identified using a statistical method. Possible shapes of multiple events are also investigated, showing a trend to follow wordlines. Finally, MUlti-Scales Single Event Phenomena Predictive Platform (MUSCA SEP3) was used to make assessment of actual environments and an improvement of single event upset (SEU) injection test is proposed.

[1]  J. Ziegler,et al.  SRIM – The stopping and range of ions in matter (2010) , 2010 .

[2]  Guillaume Hubert,et al.  Radiation Effects Investigations Based on Atmospheric Radiation Model (ATMORAD) Considering GEANT4 Simulations of Extensive Air Showers and Solar Modulation Potential , 2015, Radiation research.

[3]  A. Dell'Acqua,et al.  Geant4 - A simulation toolkit , 2003 .

[4]  Alan Edelman,et al.  Julia: A Fresh Approach to Numerical Computing , 2014, SIAM Rev..

[5]  G. Tsiligiannis,et al.  Radiation Effects on Deep Submicrometer SRAM-Based FPGAs Under the CERN Mixed-Field Radiation Environment , 2018, IEEE Transactions on Nuclear Science.

[6]  Noriaki Saito,et al.  Neutron-Induced Multiple-Cell Upsets in 20-nm Bulk SRAM: Angular Sensitivity and Impact of Multiwell Potential Perturbation , 2019, IEEE Transactions on Nuclear Science.

[7]  David S. Lee,et al.  Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates , 2015, IEEE Transactions on Nuclear Science.

[8]  Heather Quinn,et al.  A Method and Case Study on Identifying Physically Adjacent Multiple-Cell Upsets Using 28-nm, Interleaved and SECDED-Protected Arrays , 2014, IEEE Transactions on Nuclear Science.

[9]  Fernanda Lima Kastensmidt,et al.  Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC , 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

[10]  Hortensia Mecha,et al.  Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests , 2020, IEEE Transactions on Nuclear Science.

[11]  Adam R. Duncan,et al.  Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage , 2015, IEEE Transactions on Nuclear Science.

[12]  L. Artola,et al.  Continuous High-Altitude Measurements of Cosmic Ray Neutrons and SEU/MCU at Various Locations: Correlation and Analyses Based-On MUSCA SEP$^{3}$ , 2013, IEEE Transactions on Nuclear Science.

[13]  Hortensia Mecha,et al.  Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUs , 2016, IEEE Transactions on Nuclear Science.

[14]  G. Hubert,et al.  Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA ${\rm SEP}^{3}$) , 2009, IEEE Transactions on Nuclear Science.

[15]  Fernanda Lima Kastensmidt,et al.  Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA , 2017, IEEE Transactions on Nuclear Science.

[16]  S. Incerti,et al.  Geant4 developments and applications , 2006, IEEE Transactions on Nuclear Science.

[17]  裕幸 飯田,et al.  International Technology Roadmap for Semiconductors 2003の要求清浄度について － シリコンウエハ表面と雰囲気環境に要求される清浄度, 分析方法の現状について － , 2004 .

[18]  Philippe Roche,et al.  Real-time soft-error rate measurements: A review , 2014, Microelectron. Reliab..

[19]  Guillaume Hubert,et al.  Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation , 2015, Integr..

[20]  Hortensia Mecha,et al.  Influence of Randomness During the Interpretation of Results From Single-Event Experiments on SRAMs , 2019, IEEE Transactions on Device and Materials Reliability.

[21]  Hortensia Mecha,et al.  A Methodology to Emulate Single Event Upsets in Flip-Flops Using FPGAs through Partial Reconfiguration and Instrumentation , 2015, IEEE Transactions on Nuclear Science.

[22]  Michael J. Wirthlin,et al.  Dynamic SEU Sensitivity of Designs on Two 28-nm SRAM-Based FPGA Architectures , 2018, IEEE Transactions on Nuclear Science.

[23]  R. Velazco,et al.  Single-event-upset-like fault injection: a comprehensive framework , 2005, IEEE Transactions on Nuclear Science.

[24]  Masanori Hashimoto,et al.  Similarity Analysis on Neutron- and Negative Muon-Induced MCUs in 65-nm Bulk SRAM , 2019, IEEE Transactions on Nuclear Science.

[25]  M. Gadlage,et al.  Soft Errors Induced by High-Energy Electrons , 2017, IEEE Transactions on Device and Materials Reliability.

[26]  Christopher Frost,et al.  Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs , 2014, Microelectron. Reliab..

[27]  H.J. Tausch.  Simplified Birthday Statistics and Hamming EDAC , 2009, IEEE Transactions on Nuclear Science.

[28]  M. Baylac,et al.  Multipurpose applications of the accelerator-based neutron source GENEPI2 , 2016 .

[29]  Hortensia Mecha,et al.  Statistical Deviations From the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMs , 2017, IEEE Transactions on Nuclear Science.

[30]  J. Beaucour,et al.  Contribution of Thermal Neutrons to Soft Error Rate , 2018, IEEE Transactions on Nuclear Science.

[31]  Michael J. Wirthlin,et al.  Statistical Method to Extract Radiation-Induced Multiple-Cell Upsets in SRAM-Based FPGAs , 2020, IEEE Transactions on Nuclear Science.

[32]  A. R. Duncan,et al.  Impact of Neutron-Induced Displacement Damage on the Multiple Bit Upset Sensitivity of a Bulk CMOS SRAM , 2012, IEEE Transactions on Nuclear Science.

[33]  Gabriel L. Nazar,et al.  Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity , 2014, 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC).

[34]  Luca Sterpone,et al.  Ultrahigh Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-Based FPGA , 2019, IEEE Transactions on Nuclear Science.