Fault location algorithms for repairable embedded RAMs

The authors' research has led to: (1) the development of original rules for the conversion of single-bit march tests into multi-bit march tests; (2) the transformation of the new multi-bit march tests, using a 'serial shifting notation' which represents 'serial access' in embedded RAMs, into serial-access word-oriented march tests; and (3) the introduction of a new compact notation which extends the well-established march notation to include algorithms with two levels of FOR-loops (namely: the Galloping FOR-loop and the Hamming FOR-loop), since such algorithms are indispensible for locating coupling faults in cell arrays, and stuck-open faults in address decoders. Finally, a tabular summary (using both the 'hybrid serial/parallel' and the 'modular' data accessing modes) of fault location algorithms is given.<<ETX>>

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