Subcycle Mid-Infrared Electric-Field-Driven Scanning Tunneling Microscopy with a Time Resolution Higher Than 30 fs
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H. Shigekawa | S. Yoshida | O. Takeuchi | Hiroyuki Mogi | Y. Arashida | Jinbo Peng | Masashi Ishikawa | Ippo Igarashi | Akira Hatanaka | Naoki Umeda