论文信息 - NV microscopy of thermally controlled stresses caused by thin Cr2O3 films. - 字舞流文

NV microscopy of thermally controlled stresses caused by thin Cr2O3 films.

M. Zubkins | I. Fescenko | J. Smits | A. Berzins | G. Mozolevskis | A. Petruhins | Roberts Rimsa