Modelling single shot damage thresholds of multilayer optics for high-intensity short-wavelength radiation sources.
暂无分享,去创建一个
F Bijkerk | R Sobierajski | E Louis | R A Loch | J Bosgra
[1] J. Susini,et al. Table-top water window transmission x-ray microscopy: Review of the key issues, and conceptual design of an instrument for biology , 2005 .
[2] M M Murnane,et al. Bright, coherent, ultrafast soft X-ray harmonics spanning the water window from a tabletop light source. , 2010, Physical review letters.
[3] E. Ziegler,et al. Optimization of multilayer reflectivity and bandpass for soft to hard x‐ray applications [0.1–200 keV] , 1996 .
[4] H. Sinn,et al. Amorphous to crystalline phase transition in carbon induced by intense femtosecond x-ray free-electron laser pulses , 2012 .
[5] Igor A. Artyukov,et al. Carbon window soft x-ray imaging using multilayer optics , 2005, SPIE Optics + Photonics.
[6] Eric Louis,et al. Nanometer interface and materials control for multilayer EUV-optical applications , 2011 .
[7] Arthur E. Morris,et al. Handbook on material and energy balance calculations in materials processing , 2011 .
[8] F. Schäfers. Multilayers for the EUV/soft X-ray range , 2000 .
[9] Saša Bajt,et al. Thermal and stress studies of normal incidence Mo/B4C multilayers for a 6.7 nm wavelength. , 2011, Applied optics.
[10] F. Salmassi,et al. Progress in short period multilayer coatings for water window applications , 2006 .
[11] Jorge J. Rocca,et al. Mechanisms of radiation damage to Sc/Si multilayer mirrors under EUV laser irradiation , 2009 .
[12] Eric Louis,et al. Spectral properties of La/B--based multilayer mirrors near the boron K absorption edge. , 2012, Optics express.
[13] N N Salashchenko,et al. Cr /sc multilayers for the soft-x-ray range. , 1998, Applied optics.
[14] E. Gullikson,et al. Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics. , 2008, Applied optics.
[15] R. London,et al. Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. , 2011, Optics express.
[16] F. Bijkerk,et al. Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. , 2011, Optics letters.
[17] J. Kirz,et al. Soft X-ray microscopes and their biological applications , 1995, Quarterly Reviews of Biophysics.
[18] E. D. van Hattum,et al. Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. , 2010, Optics express.
[19] Charles M. Falco,et al. Survey of Ti-, B-, and Y-based soft x-ray-extreme ultraviolet multilayer mirrors for the 2- to 12-nm wavelength region. , 1996, Applied optics.
[20] U. Vogt,et al. Laboratory cryo soft X-ray microscopy. , 2012, Journal of structural biology.
[21] E. Anderson,et al. Soft X-ray microscopy at a spatial resolution better than 15 nm , 2005, Nature.
[22] M. Piecuch. Diffusion in multilayers , 1988 .
[23] Eric M. Gullikson,et al. Multilayers for next generation EUVL at 6.X nm , 2011, Optics + Optoelectronics.
[24] R. London,et al. Ionization by impact electrons in solids: Electron mean free path fitted over a wide energy range , 2005, cond-mat/0506136.
[25] J. Rocca,et al. Demonstration of a desk-top size high repetition rate soft x-ray laser. , 2005, Optics express.
[26] S. I. Sagitov,et al. Thermal stability of soft x-ray Mo-Si and MoSi(2)-Si multilayer mirrors. , 1993, Applied optics.
[27] Finn Erland Christensen,et al. Multilayer x-ray mirrors for the objective crystal spectrometer on the Spectrum Roentgen Gamma satellite , 1995, Optics & Photonics.
[28] Ryszard S. Romaniuk,et al. Operation of a free-electron laser from the extreme ultraviolet to the water window , 2007 .
[29] B. Rus,et al. Plasma-based X-ray laser at 21 nm for multidisciplinary applications , 2009 .
[30] Armin Bayer,et al. Damage threshold measurements on EUV optics using focused radiation from a table-top laser produced plasma source. , 2010, Optics express.
[31] David L. Windt,et al. IMD—software for modeling the optical properties of multilayer films , 1998 .
[32] A. Sakdinawat,et al. Nanoscale X-ray imaging , 2009 .