论文信息 - Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress - 字舞流文

Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress

R. Degraeve | B. Kaczer | I. De Wolf | Mario Gonzalez | S. Tyaginov | A. Grill | A. Kruv | Kookjin Lee | Anastasiia Kruv