论文信息 - Reliable determination of the Cu/n-Si Schottky barrier height by using in-device hot-electron spectroscopy - 字舞流文

Reliable determination of the Cu/n-Si Schottky barrier height by using in-device hot-electron spectroscopy

Xiangnan Sun | F. Casanova | L. Hueso | R. Llopis | A. Bedoya-Pinto | S. Parui | M. Ribeiro | A. Atxabal