A new column redundancy scheme for fast access time of 64-Mb DRAM

A 3.3-V 64-Mbit DRAM is fabricated using 0.4-/spl mu/m CMOS triple poly and double metal process technology. The DRAM implements a new column redundancy scheme called the data line suppression (DLS) to achieve fast access time. The widely used redundancy method for DRAMs (the address suppression scheme) has the disadvantage that access time for the redundancy column is longer than the normal column. The new DLS scheme overcomes this problem. A full chip 64-Mb DRAM which incorporates the new redundancy scheme is designed and successfully fabricated. Measurements confirm that column access time (t/sub AA/) for both the normal and redundant column are identical. It is 27 ns for typical operating conditions.<<ETX>>

[1]  T. Mano,et al.  Circuit technologies for 16Mb DRAMs , 1987, 1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[2]  S. Kayano,et al.  A 45-ns 64-Mb DRAM with a merged match-line test architecture , 1991 .

[3]  Toshiya Uchida,et al.  A 40-ns 64-Mb DRAM with 64-b parallel data bus architecture , 1991 .

[4]  K. Hoffmann,et al.  Optimized sensing scheme of DRAMs , 1989 .

[5]  Shigeru Mori,et al.  Optimized redundancy selection based on failure-related yield model for 64-Mb DRAM and beyond , 1991 .

[6]  Masashi Horiguchi,et al.  The impact of data-line interference noise on DRAM scaling , 1988 .

[7]  K. Itoh Trends in megabit DRAM circuit design , 1989, International Symposium on VLSI Technology, Systems and Applications,.

[8]  Fumio Horiguchi,et al.  A 33-ns 64-Mb DRAM , 1991 .