Testing Techniques for Hardware Security

System security has emerged as a premier design requirement. While there has been an enormous body of impressive work on testing integrated circuits (ICs) desiderata such as manufacturing correctness, delay, and power, there is no reported effort to systematically test IC security in hardware. Our goal is to provide an impetus for this line of research and development by introducing techniques and methodology for rigorous testing of physically unclonable functions (PUFs). Recently, PUFs received a great deal of attention as security mechanisms due to their flexibility to form numerous security protocols and intrinsic resiliency against physical and side channels attacks. We study three classes of PUFs properties to design pertinent test methods: (i) predictability, (ii) sensitivity to component accuracy, and (iii) susceptibility to reverse engineering. As our case studies, we analyze two popular PUF structures, linear and feed-forward, and show that their security is not adequate from several points of view. The technical highlights of the paper are the first non-destructive technique for PUF reverse engineering and a new PUF structure that is capable of passing our security tests.

[1]  Miodrag Potkonjak,et al.  Remote activation of ICs for piracy prevention and digital right management , 2007, 2007 IEEE/ACM International Conference on Computer-Aided Design.

[2]  Miodrag Potkonjak,et al.  Lightweight secure PUFs , 2008, ICCAD 2008.

[3]  David Blaauw,et al.  Statistical Analysis and Optimization for VLSI: Timing and Power , 2005, Series on Integrated Circuits and Systems.

[4]  Leonid Bolotnyy,et al.  Physically Unclonable Function-Based Security and Privacy in RFID Systems , 2007, Fifth Annual IEEE International Conference on Pervasive Computing and Communications (PerCom'07).

[5]  Miodrag Potkonjak,et al.  CAD-based Security, Cryptography, and Digital Rights Management , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[6]  Boris Skoric,et al.  An information theoretic model for physical uncloneable functions , 2004, International Symposium onInformation Theory, 2004. ISIT 2004. Proceedings..

[7]  Srinivas Devadas,et al.  Silicon physical random functions , 2002, CCS '02.

[8]  Srinivas Devadas,et al.  Identification and authentication of integrated circuits , 2004, Concurr. Pract. Exp..

[9]  Miodrag Potkonjak,et al.  Trusted Integrated Circuits: A Nondestructive Hidden Characteristics Extraction Approach , 2008, Information Hiding.

[10]  Farinaz Koushanfar,et al.  Noninvasive leakage power tomography of integrated circuits by compressive sensing , 2008, Proceeding of the 13th international symposium on Low power electronics and design (ISLPED '08).

[11]  Farinaz Koushanfar,et al.  N-variant IC design: Methodology and applications , 2008, 2008 45th ACM/IEEE Design Automation Conference.

[12]  G. Edward Suh,et al.  Physical Unclonable Functions for Device Authentication and Secret Key Generation , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[13]  Jarrod A. Roy,et al.  EPIC: Ending Piracy of Integrated Circuits , 2008, 2008 Design, Automation and Test in Europe.

[14]  Srinivas Devadas,et al.  Delay-based circuit authentication and applications , 2003, SAC '03.

[15]  Ross J. Anderson Security engineering - a guide to building dependable distributed systems (2. ed.) , 2001 .

[16]  Marten van Dijk,et al.  A technique to build a secret key in integrated circuits for identification and authentication applications , 2004, 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525).

[17]  Farinaz Koushanfar,et al.  Active Hardware Metering for Intellectual Property Protection and Security , 2007, USENIX Security Symposium.

[18]  Srivaths Ravi,et al.  Security in embedded systems: Design challenges , 2004, TECS.

[19]  Miodrag Potkonjak,et al.  Input vector control for post-silicon leakage current minimization in the presence of manufacturing variability , 2008, 2008 45th ACM/IEEE Design Automation Conference.

[20]  Farinaz Koushanfar,et al.  Post-silicon timing characterization by compressed sensing , 2008, 2008 IEEE/ACM International Conference on Computer-Aided Design.

[21]  Peter Y. K. Cheung,et al.  Within-die delay variability in 90nm FPGAs and beyond , 2006, 2006 IEEE International Conference on Field Programmable Technology.

[22]  Sani R. Nassif,et al.  High Performance CMOS Variability in the 65nm Regime and Beyond , 2006, 2007 IEEE International Electron Devices Meeting.

[23]  Frank Liu,et al.  A General Framework for Spatial Correlation Modeling in VLSI Design , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[24]  W. R. Daasch,et al.  IC identification circuit using device mismatch , 2000, 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).

[25]  Stephen A. Benton,et al.  Physical one-way functions , 2001 .

[26]  R. Pappu,et al.  Physical One-Way Functions , 2002, Science.

[27]  Farinaz Koushanfar,et al.  Active control and digital rights management of integrated circuit IP cores , 2008, CASES '08.

[28]  Jorge Guajardo,et al.  FPGA Intrinsic PUFs and Their Use for IP Protection , 2007, CHES.