论文信息 - Optical characterization by variable angle spectroscopic ellipsometry of nitrogen-doped MgxZn1 − xO thin films prepared by the plasma-assisted reactive evaporation method - 字舞流文

Optical characterization by variable angle spectroscopic ellipsometry of nitrogen-doped MgxZn1 − xO thin films prepared by the plasma-assisted reactive evaporation method

H. Osada | Michio Suzuki | T. Fujiwara | Y. Kashiwaba | T. Abe | S. Chiba | A. Nakagawa | I. Niikura | M. Daibo | K. Tsutsumi | Y. Kashiwaba | T. Chiba | M. Nakagawa | Shuzo Takahashi | T. Ojima | K. Aota | S. Takahashi | Tsutomu Ojima