On automatic-verification pattern generation for SoC withport-order fault model

Embedded cores are being increasingly used in the design of large system-on-a-chip (SoC). Because of the high complexity of SoC, the design verification is a challenge for system integrators. To reduce the verification complexity, the port-order fault (POF) model has been used for verifying core-based designs (Tang and Jou, 1998). In this paper, we present an automatic-verification pattern generation (AVPG) for SoC design verification based on the POF model and perform experiments on combinational and sequential benchmarks. Experimental results show that our AVPG can efficiently generate verification patterns with high POF coverage.

[1]  Benoit Nadeau-Dostie,et al.  BIST of PCB interconnects using boundary-scan architecture , 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[2]  Melvin A. Breuer,et al.  Digital systems testing and testable design , 1990 .

[3]  Grant Martin,et al.  Surviving the SOC Revolution: A Guide to Platform-Based Design , 1999 .

[4]  Janick Bergeron,et al.  Writing Testbenches: Functional Verification of HDL Models , 2000 .

[5]  Kwang-Ting Cheng,et al.  A functional fault model for sequential machines , 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[6]  Prabhakar Goel,et al.  Electronic Chip-In-Place Test , 1982, DAC 1982.

[7]  Robert K. Brayton,et al.  Sequential circuit design using synthesis and optimization , 1992, Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors.

[8]  Michael H. Schulz,et al.  SOCRATES: a highly efficient automatic test pattern generation system , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[9]  Jing-Yang Jou,et al.  A Logical Fault Model for Library Coherence Checking , 1998, J. Inf. Sci. Eng..

[10]  Yervant Zorian,et al.  Towards a standard for embedded core test: an example , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[11]  Alberto L. Sangiovanni-Vincentelli,et al.  Interface-based design , 1997, DAC.

[12]  Yervant Zorian,et al.  Testing Embedded-Core-Based System Chips , 1999, Computer.

[13]  Jing-Yang Jou,et al.  Verification pattern generation for core-based design using port order fault model , 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

[14]  S. Runyon Testing big chips becomes an internal affair , 1999 .