Stress effects on the anisotropic thermal expansions of “martensitic” A15 compounds

Abstract Precision capacitance dilatometry provides a sensitive measure of the thermal strain developed in a sample undergoing a structural distortion with its varying temperature. The A15 structure compounds, V3Si and Nb3Sn, are well known to undergo distortion from their cubic structures at room temperature to tetragonal structures (c/a > 1 for V3Si and c/a < 1 for Nb3Sn) at low temperatures. In the past, highly anomalous thermal expansion behaviour recorded for these materials has been attributed to a strongly anharmonic lattice potential manifesting itself in unusually high, and strongly temperature-dependent, Gruneisen parameters. Further studies on polycrystalline material revealed this anomalous expansion to be highly anisotropic at temperatures for which, according to conventional diffraction data, the materials are cubic. This behaviour was linked to control of sample morphology by a residual stress field resulting from sample preparation. More recent experiments, in which the transformation morp...

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