A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
暂无分享,去创建一个
L. Dilillo | C. Frost | F. Wrobel | F. Saigne | H. Puchner | A. Zadeh | A. Virtanen | A. Bosser | V. Gupta | G. Tsiligiannis | A. Javanainen | R. Ferraro | M. Rossi
[1] G. Tsiligiannis,et al. Dynamic Test Methods for COTS SRAMs , 2014, IEEE Transactions on Nuclear Science.
[2] Giuseppe Gorini,et al. A new dedicated neutron facility for accelerated SEE testing at the ISIS facility , 2009, 2009 IEEE International Reliability Physics Symposium.
[3] V. Ferlet-Cavrois,et al. Low Energy Protons at RADEF - Application to Advanced eSRAMs , 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).
[4] A. Chandrakasan,et al. Analyzing static noise margin for sub-threshold SRAM in 65nm CMOS , 2005, Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005..
[5] R. Harboe-Sørensen,et al. Semi-Empirical LET Descriptions of Heavy Ions Used in the European Component Irradiation Facilities , 2009, IEEE Transactions on Nuclear Science.