论文信息 - From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology)

From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology)

With the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to building the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed.

Su Mi Park Dahlgaard | Jens J. Dahlgaard

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