Investigation of surface properties of lunar regolith: Part I

This paper describes an initial investigation of the surface properties of three lunar soil samples from the Apollo 11, 12 and 16 missions, respectively. We report on density measurements using a helium pycnometer, adsorption isotherms of krypton applied for the determination of specific surface area of the samples and gravimetric measurement of the isotherms of water, heptane and octane. Electron-microscopic photographs are described and discussed.

[1]  P. Staszczuk,et al.  Determination of total heterogeneity and fractal dimensions of high-temperature superconductors , 2003 .

[2]  H. Wänke,et al.  Composition and evolution of the lunar crust in the Descartes highlands, Apollo 16. , 1985 .

[3]  Douglas M. Smith,et al.  Characterization of Porous Solids , 1994 .

[4]  E. Robens,et al.  Studies of heterogeneity properties of selected high-temperature superconductor surfaces , 2006 .

[5]  E. L. Fuller,et al.  Volumetric and gravimetric methods of determining monolayer capacities , 1979 .

[6]  J. Reid,et al.  Mineralogy and petrology of the Apollo 12 lunar sample , 1971 .

[7]  E. Robens,et al.  Thermogravimetric and Sorption Measurement Techniques/Instruments , 2002 .

[8]  Alan B. Binder,et al.  Polar hydrogen deposits on the Moon , 2000 .

[9]  B. M. Kats,et al.  Universal function for the description of multi-layer adsorption isotherms , 2006 .

[10]  E. Robens,et al.  Standardization of Methods for Characterizing the Surface Geometry of Solids , 2003 .

[11]  Erich Robens,et al.  Microstructure and thermal analysis of solid surfaces , 1983 .

[12]  D. Möhlmann.  Unfrozen subsurface water on Mars: presence and implications , 2003, International Journal of Astrobiology.

[13]  N. Wagner,et al.  Some surface characteristics and gas interactions of Apollo 14 fines and rock fragments. , 1972 .

[14]  W. Steckelmacher.  Progress in vacuum microbalance techniques , 1973 .

[15]  A. Basu,et al.  Submillimeter grain‐size distribution of Apollo 11 soil 10084 , 2000 .