Semiconductor Device Model Parameter Extraction Based on Genetic Algorithm

With the dimension of the semiconductor device scaling down,the model of the devices becoming more and more complex,the number of the model parameters also increasing,traditional gradient-based parameter extraction methods have more and more difficulty to deal with the models which have hundreds of parameters.Genetic algorithm based parameter extraction methods attracte tremendous attention since they can overcome the difficulty of traditional methods.Here the theory of genetic algorithm based parameter extraction method is illustrated,and the defects and some improvements are also put forward.