X-RAY INTERFERENCE METHODS OF ELECTRON BEAM DIAGNOSTICS

Electron beam diagnostics methods based on interference and diffraction of synchrotron radiation (SR) in hard X-ray range will be discussed. Two simple optical schemes providing X-ray interference patterns highly sensitive to transverse size of the emitting electron beam, will be considered. For each scheme, the visibility of fringes in the pattern depends on transverse size of the electron beam. However, the pattern is also determined by the scheme geometry, shape and material of diffracting bodies. Therefore, for correct interpretation of the experimental results, high-accuracy computation of SR emission and propagation in the framework of physical optics should be used. Examples of practical measurements and processing of the results are presented.