论文信息 - Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique–impedance spectroscopy analysis - 字舞流文

Long time stability of ITO/NiPc/ZnO/Al devices with ZnO buffer layer formed by atomic layer deposition technique–impedance spectroscopy analysis

E. Guziewicz | M. Godlewski | G. Luka | Z. Hotra | I. Grygorchak | P. Stakhira | V. Cherpak | G. Pakhomov | D. Volynyuk | F. Ivastchyshyn