Integrated optic error detecting circuit using Ti:LiNbO 3 interferometric light modulators

An electrooptic error detecting circuit is proposed and demonstrated which is constructed by integrating an array of waveguide interferometers with multielectrodes. When the electric signals corresponding to the error detecting codes are applied to the present device, the error detection signals are obtained as optical signals from the waveguide outputs. From these optical outputs it is found whether the input signals include errors or not, and which bit, if there is any error, is an error bit. The performance is confirmed by using an experimental device for seven-bit Hamming codes.

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