Degradation of vertical GaN FETs under gate and drain stress
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Gaudenzio Meneghesso | Enrico Zanoni | Matteo Meneghini | Tomás Palacios | Carlo De Santi | M. Sun | Maria Ruzzarin | T. Palacios | M. Meneghini | G. Meneghesso | E. Zanoni | C. D. Santi | M. Ruzzarin | Min-Nan Sun
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