Unsupervised learning for signal mapping in dynamic photon emission

Dynamic photon emission is an efficient tool for timing analysis of various areas. However, advances in transistors integration bring more complex test patterns and more objects to investigate. As a consequence, understanding the analyzed area and finding nodes of interest can be difficult. In this paper, a method for drawing synthesis of the various signals met inside an area is reported. It is based on unsupervised learning tool for dimension reduction and clustering. The process is applied to real data to show its efficiency and its quality is evaluated.

[1]  Thierry Parrassin.  Laser Voltage Imaging and Its Derivatives, Efficient Techniques to Address Defect On 28nm Technology , 2013 .

[2]  Julie Ferrigno,et al.  When AES blinks: introducing optical side channel , 2008, IET Inf. Secur..

[3]  Sven Frohmann,et al.  Highly resolved spatial and temporal photoemission analysis of integrated circuits , 2013 .

[4]  J. Kash,et al.  Picosecond hot electron light emission from submicron complementary metal–oxide–semiconductor circuits , 1997 .

[5]  E. Forgy,et al.  Cluster analysis of multivariate data : efficiency versus interpretability of classifications , 1965 .

[6]  Herve Deslandes.  From EBT to LVP, from 130nm to 28nm node, Internal Timing Characterization Evolution , 2012 .

[7]  A. Shimase,et al.  Case studies on application of Time Resolved Imaging Emission Microscopy for backside timing analysis , 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

[8]  Romain Desplats,et al.  A new approach for faster IC analysis with PICA: STPC-3D , 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.

[9]  David P. Vallett,et al.  Picosecond imaging circuit analysis , 1998, IBM J. Res. Dev..

[10]  Rui Xu,et al.  Survey of clustering algorithms , 2005, IEEE Transactions on Neural Networks.

[11]  Alan J. Weger.  32nm CMOS SOI Test Site for Emission Tool Evaluation , 2013 .

[12]  P. Perdu,et al.  New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI , 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

[13]  A. Benigni,et al.  Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis , 2011, Microelectron. Reliab..

[14]  Karl Pearson F.R.S..  LIII. On lines and planes of closest fit to systems of points in space , 1901 .

[15]  Stéphane Binczak,et al.  Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location , 2015, J. Electronic Imaging.

[16]  Stéphane Binczak,et al.  Frequency mapping in dynamic light emission with wavelet transform , 2013, Microelectron. Reliab..