Measurement of femtosecond laser-induced damage and ablation thresholds in dielectrics
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N. Sanner | M. Sentis | T. Itina | O. Utéza | O. Uteza | N. Sanner | M. Sentis | T. Itina | G. Coustillier | B. Bussiere | G. Coustillier | A. Leray | A. Leray | B. Bussière
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