A new on-state drain-bias TDDB lifetime model and HCI effect on drain-bias TDDB of ultra thin oxide
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K. Wu | P.J. Liao | Y.S. Tsai | Chia Lin Chen | J.W. Young | C.J. Wang | K. Wu | P. Liao | C. Chen | Y. Tsai | J. Young | C.J. Wang
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