SP: An Advanced Surface-Potential-Based Compact MOSFET Model (invited)
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G. S. Gildenblat | X. Gu | H. Wang | X. Cai
[1] W. Liu,et al. A CAD-compatible non-quasi-static MOSFET model , 1996, International Electron Devices Meeting. Technical Digest.
[2] G. Gildenblat,et al. Scattering matrix based compact MOSFET model , 2002, Digest. International Electron Devices Meeting,.
[3] J. Victory,et al. A time-dependent, surface potential based compact model for MOS capacitors , 2001, IEEE Electron Device Letters.
[4] J. Brews. A charge-sheet model of the MOSFET , 1978 .
[5] C. Sah,et al. Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconductor transistors☆ , 1966 .
[6] Weimin Wu,et al. Physics-based mathematical conditioning of the MOSFET surface potential equation , 2004, IEEE Transactions on Electron Devices.
[7] N. Arora. MOSFET Models for VLSI Circuit Simulation , 1993 .
[8] C. Hu,et al. A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors , 1990 .
[9] H. Gummel,et al. Inversion charge modeling , 2001 .
[10] G Gildenblat,et al. Substrate Current in Surface-Potential-Based Compact MOSFET Models , 2003 .
[11] L.F. Tiemeijer,et al. Compact modeling of drain and gate current noise for RF CMOS , 2002, Digest. International Electron Devices Meeting,.
[12] G. Gildenblat,et al. Analytical approximation for the MOSFET surface potential , 2001 .
[13] William Liu,et al. MOSFET Models for SPICE Simulation: Including BSIM3v3 and BSIM4 , 2001 .
[14] F. Klaassen,et al. An explicit surface-potential-based MOSFET model for circuit simulation , 2000 .
[15] T. P. Chen. A simple technique to determine barrier height change in gate oxide caused by electrical stress , 2002 .
[16] Chenming Hu,et al. Hot-electron-induced MOSFET degradation—Model, monitor, and improvement , 1985, IEEE Transactions on Electron Devices.
[17] L. Esaki,et al. Tunneling in a finite superlattice , 1973 .
[18] Mitiko Miura-Mattausch,et al. Analytical MOSFET model for quarter micron technologies , 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[19] Carlos Galup-Montoro,et al. An explicit physical model for the long-channel MOS transistor including small-signal parameters , 1995 .
[20] Dominique Savignac,et al. Unified complete MOSFET model for analysis of digital and analog circuits , 1994, ICCAD '94.
[21] Jin He,et al. An Advanced Surface-Potential-Plus MOSFET Model , 2003 .
[22] Claudio Turchetti,et al. A CAD-Oriented Analytical MOSFET Model for High-Accuracy Applications , 1984, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[23] G. Gildenblat,et al. A surface potential-based compact model of n-MOSFET gate-tunneling current , 2004, IEEE Transactions on Electron Devices.
[24] C. C. McAndrew,et al. Accuracy of approximations in MOSFET charge models , 2002 .
[25] C. Turchetti,et al. A CAD-oriented non-quasi-static approach for the transient analysis of MOS ICs , 1986 .
[26] M. Shur,et al. Unified charge control model and subthreshold current in heterostructure field-effect transistors , 1990, IEEE Electron Device Letters.
[27] Daniel P. Foty,et al. MOSFET Modeling With SPICE: Principles and Practice , 1996 .
[28] B. Hoefflinger,et al. A parametric short-channel MOS transistor model for subthreshold and strong inversion current , 1984, IEEE Journal of Solid-State Circuits.
[29] R.W. Dutton,et al. A charge-oriented model for MOS transistor capacitances , 1978, IEEE Journal of Solid-State Circuits.
[30] J. T. Clemens,et al. Characterization of the electron mobility in the inverted <100> Si surface , 1979, 1979 International Electron Devices Meeting.
[31] Ali Hajimiri,et al. A general theory of phase noise in electrical oscillators , 1998 .
[32] Z. Ren,et al. Simulation of nanoscale MOSFETs: a scattering theory interpretation , 2000 .
[33] G. Gildenblat,et al. Symmetric bulk charge linearisation in charge-sheet MOSFET model , 2001 .
[34] Ping K. Ko,et al. Chapter 1 - Approaches to Scaling , 1989 .
[35] D.B.M. Klaassen,et al. A large signal non-quasi-static MOS model for RF circuit simulation , 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
[36] T.N. Nguyen,et al. Physical mechanisms responsible for short channel effects in MOS devices , 1981, 1981 International Electron Devices Meeting.
[37] G. Gildenblat,et al. One-flux theory of a nonabsorbing barrier , 2002 .
[38] R. Rios,et al. PCIM: a physically based continuous short-channel IGFET model for circuit simulation , 1994 .
[39] Hong June Park,et al. A charge sheet capacitance model of short channel MOSFETs for SPICE , 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[40] D.B.M. Klaassen,et al. Gate current: Modeling, /spl Delta/L extraction and impact on RF performance , 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
[41] Matthias Bucher,et al. Inversion charge linearization in MOSFET modeling and rigorous derivation of the EKV compact model , 2003 .
[42] G. Gildenblat,et al. Analytical approximation for perturbation of MOSFET surface potential by polysilicon depletion layer , 1999 .
[43] Norman Scheinberg,et al. A computer simulation model for simulating distortion in FETresistors , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[44] K. Mistry,et al. A general partition scheme for gate leakage current suitable for MOSFET compact models , 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
[45] E. Vittoz,et al. An analytical MOS transistor model valid in all regions of operation and dedicated to low-voltage and low-current applications , 1995 .
[46] N. Arora,et al. A semi-empirical model of the MOSFET inversion layer mobility for low-temperature operation , 1987, IEEE Transactions on Electron Devices.
[47] G. Gildenblat,et al. Closed-form approximation for the perturbation of MOSFET surface potential by quantum-mechanical effects , 2000 .
[48] Tor A. Fjeldly,et al. Unified substrate current model for MOSFETs , 1997 .
[49] M. J. Deen,et al. Channel noise modeling of deep submicron MOSFETs , 2002 .
[50] G. Gildenblat,et al. Quasi-static and nonquasi-static compact MOSFET models based on symmetric linearization of the bulk and inversion charges , 2003 .
[51] G Gildenblat,et al. Overview of An Advanced Surface-Potential-Based MOSFET Model (SP) , 2002 .
[52] N. D. Arora,et al. Characterization and modeling of the n- and p-channel MOSFETs inversion-layer mobility in the range 25–125°C , 1994 .
[53] P. Klein,et al. Description of the bias dependent overlap capacitance at LDD MOSFETs for circuit applications , 1993, Proceedings of IEEE International Electron Devices Meeting.
[54] Gennady Gildenblat,et al. SP: an advanced surface-potential-based compact MOSFET model , 2003, IEEE Journal of Solid-State Circuits.
[55] Shinichi Tanaka,et al. On the Carrier Mobility in Forward-Biased Semiconductor Barriers. , 1995 .
[56] Yun Seop Yu,et al. A new CAD-compatible non-quasi-static MOS transient model with direct inclusion of depletion charge variations , 1998 .
[57] C. Turchetti,et al. A non-quasi-static analysis of the transient behavior of the long-channel most valid in all regions of operation , 1987, IEEE Transactions on Electron Devices.
[58] C. C. McAndrew,et al. An improved MOSFET model for circuit simulation , 1998 .