SP: An Advanced Surface-Potential-Based Compact MOSFET Model (invited)

This work describes an advanced physics-based compact MOSFET model (SP). Both the quasi-static and non-quasistatic versions of SP are surface-potential-based. The model is symmetric, includes the accumulation region, small-geometry effects, and has a consistent current and charge formulation. The surface potential is computed analytically and there are no iterative loops anywhere in the model. Availability of the surface potential in the source-drain overlap regions enables a physics-based formulation of the extrinsic model (e.g. gate tunneling current) and allows for a noise model free of discontinuities or unphysical interpolation schemes. Simulation results are used to illustrate the interplay between the model structure and circuit design.

[1]  W. Liu,et al.  A CAD-compatible non-quasi-static MOSFET model , 1996, International Electron Devices Meeting. Technical Digest.

[2]  G. Gildenblat,et al.  Scattering matrix based compact MOSFET model , 2002, Digest. International Electron Devices Meeting,.

[3]  J. Victory,et al.  A time-dependent, surface potential based compact model for MOS capacitors , 2001, IEEE Electron Device Letters.

[4]  J. Brews A charge-sheet model of the MOSFET , 1978 .

[5]  C. Sah,et al.  Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconductor transistors☆ , 1966 .

[6]  Weimin Wu,et al.  Physics-based mathematical conditioning of the MOSFET surface potential equation , 2004, IEEE Transactions on Electron Devices.

[7]  N. Arora MOSFET Models for VLSI Circuit Simulation , 1993 .

[8]  C. Hu,et al.  A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors , 1990 .

[9]  H. Gummel,et al.  Inversion charge modeling , 2001 .

[10]  G Gildenblat,et al.  Substrate Current in Surface-Potential-Based Compact MOSFET Models , 2003 .

[11]  L.F. Tiemeijer,et al.  Compact modeling of drain and gate current noise for RF CMOS , 2002, Digest. International Electron Devices Meeting,.

[12]  G. Gildenblat,et al.  Analytical approximation for the MOSFET surface potential , 2001 .

[13]  William Liu,et al.  MOSFET Models for SPICE Simulation: Including BSIM3v3 and BSIM4 , 2001 .

[14]  F. Klaassen,et al.  An explicit surface-potential-based MOSFET model for circuit simulation , 2000 .

[15]  T. P. Chen A simple technique to determine barrier height change in gate oxide caused by electrical stress , 2002 .

[16]  Chenming Hu,et al.  Hot-electron-induced MOSFET degradation—Model, monitor, and improvement , 1985, IEEE Transactions on Electron Devices.

[17]  L. Esaki,et al.  Tunneling in a finite superlattice , 1973 .

[18]  Mitiko Miura-Mattausch,et al.  Analytical MOSFET model for quarter micron technologies , 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[19]  Carlos Galup-Montoro,et al.  An explicit physical model for the long-channel MOS transistor including small-signal parameters , 1995 .

[20]  Dominique Savignac,et al.  Unified complete MOSFET model for analysis of digital and analog circuits , 1994, ICCAD '94.

[21]  Jin He,et al.  An Advanced Surface-Potential-Plus MOSFET Model , 2003 .

[22]  Claudio Turchetti,et al.  A CAD-Oriented Analytical MOSFET Model for High-Accuracy Applications , 1984, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[23]  G. Gildenblat,et al.  A surface potential-based compact model of n-MOSFET gate-tunneling current , 2004, IEEE Transactions on Electron Devices.

[24]  C. C. McAndrew,et al.  Accuracy of approximations in MOSFET charge models , 2002 .

[25]  C. Turchetti,et al.  A CAD-oriented non-quasi-static approach for the transient analysis of MOS ICs , 1986 .

[26]  M. Shur,et al.  Unified charge control model and subthreshold current in heterostructure field-effect transistors , 1990, IEEE Electron Device Letters.

[27]  Daniel P. Foty,et al.  MOSFET Modeling With SPICE: Principles and Practice , 1996 .

[28]  B. Hoefflinger,et al.  A parametric short-channel MOS transistor model for subthreshold and strong inversion current , 1984, IEEE Journal of Solid-State Circuits.

[29]  R.W. Dutton,et al.  A charge-oriented model for MOS transistor capacitances , 1978, IEEE Journal of Solid-State Circuits.

[30]  J. T. Clemens,et al.  Characterization of the electron mobility in the inverted <100> Si surface , 1979, 1979 International Electron Devices Meeting.

[31]  Ali Hajimiri,et al.  A general theory of phase noise in electrical oscillators , 1998 .

[32]  Z. Ren,et al.  Simulation of nanoscale MOSFETs: a scattering theory interpretation , 2000 .

[33]  G. Gildenblat,et al.  Symmetric bulk charge linearisation in charge-sheet MOSFET model , 2001 .

[34]  Ping K. Ko,et al.  Chapter 1 - Approaches to Scaling , 1989 .

[35]  D.B.M. Klaassen,et al.  A large signal non-quasi-static MOS model for RF circuit simulation , 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).

[36]  T.N. Nguyen,et al.  Physical mechanisms responsible for short channel effects in MOS devices , 1981, 1981 International Electron Devices Meeting.

[37]  G. Gildenblat,et al.  One-flux theory of a nonabsorbing barrier , 2002 .

[38]  R. Rios,et al.  PCIM: a physically based continuous short-channel IGFET model for circuit simulation , 1994 .

[39]  Hong June Park,et al.  A charge sheet capacitance model of short channel MOSFETs for SPICE , 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[40]  D.B.M. Klaassen,et al.  Gate current: Modeling, /spl Delta/L extraction and impact on RF performance , 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

[41]  Matthias Bucher,et al.  Inversion charge linearization in MOSFET modeling and rigorous derivation of the EKV compact model , 2003 .

[42]  G. Gildenblat,et al.  Analytical approximation for perturbation of MOSFET surface potential by polysilicon depletion layer , 1999 .

[43]  Norman Scheinberg,et al.  A computer simulation model for simulating distortion in FETresistors , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[44]  K. Mistry,et al.  A general partition scheme for gate leakage current suitable for MOSFET compact models , 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

[45]  E. Vittoz,et al.  An analytical MOS transistor model valid in all regions of operation and dedicated to low-voltage and low-current applications , 1995 .

[46]  N. Arora,et al.  A semi-empirical model of the MOSFET inversion layer mobility for low-temperature operation , 1987, IEEE Transactions on Electron Devices.

[47]  G. Gildenblat,et al.  Closed-form approximation for the perturbation of MOSFET surface potential by quantum-mechanical effects , 2000 .

[48]  Tor A. Fjeldly,et al.  Unified substrate current model for MOSFETs , 1997 .

[49]  M. J. Deen,et al.  Channel noise modeling of deep submicron MOSFETs , 2002 .

[50]  G. Gildenblat,et al.  Quasi-static and nonquasi-static compact MOSFET models based on symmetric linearization of the bulk and inversion charges , 2003 .

[51]  G Gildenblat,et al.  Overview of An Advanced Surface-Potential-Based MOSFET Model (SP) , 2002 .

[52]  N. D. Arora,et al.  Characterization and modeling of the n- and p-channel MOSFETs inversion-layer mobility in the range 25–125°C , 1994 .

[53]  P. Klein,et al.  Description of the bias dependent overlap capacitance at LDD MOSFETs for circuit applications , 1993, Proceedings of IEEE International Electron Devices Meeting.

[54]  Gennady Gildenblat,et al.  SP: an advanced surface-potential-based compact MOSFET model , 2003, IEEE Journal of Solid-State Circuits.

[55]  Shinichi Tanaka,et al.  On the Carrier Mobility in Forward-Biased Semiconductor Barriers. , 1995 .

[56]  Yun Seop Yu,et al.  A new CAD-compatible non-quasi-static MOS transient model with direct inclusion of depletion charge variations , 1998 .

[57]  C. Turchetti,et al.  A non-quasi-static analysis of the transient behavior of the long-channel most valid in all regions of operation , 1987, IEEE Transactions on Electron Devices.

[58]  C. C. McAndrew,et al.  An improved MOSFET model for circuit simulation , 1998 .