Fabrication and Characterization of Thin-Barrier HEMTs
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L. Eastman | W. Schaff | N. Rorsman | Xiang Gao | Shiping Guo | O. Axelsson | M. Fagerlind | J. Felbinger
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L. Eastman | W. Schaff | N. Rorsman | Xiang Gao | Shiping Guo | O. Axelsson | M. Fagerlind | J. Felbinger