Evaluating the Uncertainty of Digitizing Waveform Recorders Coherently With the GUM

The performance parameters defined in the IEEE Standard 1057–2007 do not specify the standard uncertainty of the reconstruction levels of digitizing waveform recorders. Not knowing the standard uncertainty of the reconstruction levels affects, in turn, the evaluation of the uncertainty of a number of measurement approaches, based on digital signal processing techniques, which utilize the data collected by a digitizing waveform recorder as the input data. A method to evaluate the uncertainty of memoryless waveform recorders embedded in off-the-shelf digitizing oscilloscopes is proposed here. The method is based on an experimental approach that can be carried out anytime the input signal is repetitive, the frequency response of the oscilloscope can be considered flat, and the dynamical effects are negligible. To qualify the proposed method, the uncertainty estimation obtained by applying it in several experiments is compared with that gained by means of a B-type evaluation.

[1]  Antonio Pietrosanto,et al.  Structured approach to estimate the measurement uncertainty in digital signal elaboration algorithms , 1999 .

[2]  Ciro Spataro,et al.  Can the effective number of bits be useful to assess the measurement uncertainty? , 2002, IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276).

[3]  C. Liguori,et al.  Propagation of uncertainty in a discrete Fourier transform algorithm , 2000 .

[4]  Michele Vadursi,et al.  An Efficient Pre-Processing Scheme to Enhance Resolution in Band-Pass Signals Acquisition , 2012, IEEE Transactions on Instrumentation and Measurement.

[5]  Rosario Schiano Lo Moriello,et al.  A complete system to generate electrical noise with arbitrary power spectral density , 2015 .

[6]  E. Ghiani,et al.  Auto-evaluation of the uncertainty in virtual instruments , 2004, IEEE Transactions on Instrumentation and Measurement.

[7]  Ciro Spataro,et al.  Approaches to evaluate the virtual instrumentation measurement uncertainties , 2002, IEEE Trans. Instrum. Meas..

[8]  Massimo D'Apuzzo,et al.  Modeling DAC Output Waveforms , 2010, IEEE Transactions on Instrumentation and Measurement.

[9]  S. Standard.  GUIDE TO THE EXPRESSION OF UNCERTAINTY IN MEASUREMENT , 2006 .

[10]  Pasquale Daponte,et al.  An ADC histogram test based on small-amplitude waves , 2002 .

[11]  Florence Azaïs,et al.  Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST , 2001, J. Electron. Test..

[12]  Hsin-Wen Ting,et al.  Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction , 2011, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[13]  Michael P. Flynn,et al.  Statistical Analysis of ENOB and Yield in Binary Weighted ADCs and DACS With Random Element Mismatch , 2012, IEEE Transactions on Circuits and Systems I: Regular Papers.

[14]  Daniel Belega,et al.  A High-Performance Procedure for Effective Number of Bits Estimation in Analog-to-Digital Converters , 2011, IEEE Transactions on Instrumentation and Measurement.

[15]  Rosario Schiano Lo Moriello,et al.  Compressive sampling-based strategy for enhancing ADCs resolution , 2014 .

[16]  Michele Vadursi,et al.  Design and Implementation of a Preprocessing Circuit for Bandpass Signals Acquisition , 2014, IEEE Transactions on Instrumentation and Measurement.

[17]  J. Schoukens.  A critical note on histogram testing of data acquisition channels , 1995 .

[18]  Massimo D'Apuzzo,et al.  A wide-band DSO architecture based on three time interleaved channels , 2016 .

[19]  Annalisa Liccardo,et al.  Parameters and Methods for ADCs Testing Compliant With the Guide to the Expression of Uncertainty in Measurements , 2017, IEEE Transactions on Instrumentation and Measurement.

[20]  R. Allan Belcher,et al.  Ieee Transactions on Instrumentation and Measurement 1 Adc Standard Iec 60748-4-3: Precision Measurement of Alternative Enob without a Sine Wave , 2022 .

[21]  D. K. Mishra,et al.  Gain error, offset error and ENOB estimation of an A/D converter using histogram technique , 2009 .

[22]  Daniel Belega,et al.  Statistical Performance of the Effective-Number-of-Bit Estimators Provided by the Sine-Fitting Algorithms , 2013, IEEE Transactions on Instrumentation and Measurement.

[23]  Andrew J. Fleming,et al.  Improving Digital-to-Analog Converter Linearity by Large High-Frequency Dithering , 2017, IEEE Transactions on Circuits and Systems I: Regular Papers.

[24]  Florence Azaïs,et al.  A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs , 2001, J. Electron. Test..

[25]  Nicola Pasquino,et al.  ANOVA-Based Approach for DAC Diagnostics , 2012, IEEE Transactions on Instrumentation and Measurement.

[26]  Eduardo J. Peralías,et al.  ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method , 2009, 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop.

[27]  A. Cruz Serra,et al.  Overdrive in the standard histogram test of ADCs , 2004 .

[28]  Thomas E. Linnenbrink.  Effective Bits: Is That All There Is? , 1984, IEEE Transactions on Instrumentation and Measurement.

[29]  A. Cruz Serra,et al.  Error in the estimation of transition voltages with the standard histogram test of ADCs , 2004 .

[30]  Alessandro Ferrero,et al.  A method based on random-fuzzy variables for online estimation of the measurement uncertainty of DSP-based instruments , 2004, IEEE Transactions on Instrumentation and Measurement.

[31]  Bernard Friedland.  On definitions of bandwidth and response time , 2016, 2016 IEEE 11th Conference on Industrial Electronics and Applications (ICIEA).