Preface: 27th International Conference on Defects in Semiconductors (ICDS-2013)

The proceedings of the 27th International Conference on Defects in Semiconductors is a co-publication with Journal of Applied Physics. The bulk of the papers, after peer review, have been published as a volume of AIP Proceedings with a selection of papers published separately as a special topic section of Journal of Applied Physics (http://scitation.aip.org/content/aip/journal/jap/115/1).