A comprehensive Single Event Effects (SEE) characterization of advanced commercial technologies was conducted using the heavy-ion test facility at Texas A&M. The components evaluated included a 322,000 gate Virtex reprogrammable FPGA (XQVR300) from Xilinx, and several manufacturers versions of 4Meg Zero Burst Turnaround (ZBT ) SRAMs. The SRAMs all unfortunately latched-up at or below an LET of 60 MeV-cm/mg and no further testing was done. However, the Virtex FPGA was immune to single event latch-up up to an LET of 125 MeV-cm/mg. Detailed single event upset testing was then done in both static as well as dynamic operating conditions to be able to understand the upset modes and develop mitigation strategies for a space based reconfigurable computing application. The upset sensitivity and detection and mitigation techniques are discussed and the results indicate that the Virtex FPGA is a good candidate for satellite applications
[1]
M. Caffrey,et al.
High-performance signal and image processing for remote sensing using reconfigurable computers
,
1999,
Optics & Photonics.
[2]
M. Caffrey,et al.
SEU Mitigation Techniques for Virtex FPGAs in Space Applications
,
1999
.
[3]
John D. Villasenor,et al.
Configurable computing solutions for automatic target recognition
,
1996,
1996 Proceedings IEEE Symposium on FPGAs for Custom Computing Machines.
[4]
Mark E. Dunham,et al.
Reconfigurable Computer Array: The Bridge between High Speed Sensors and Low Speed Computing
,
1998,
FPL.
[5]
Brad Hutchings,et al.
The flexibility of configurable computing
,
1998
.