论文信息 - Study of dislocation EBIC image width in GaN films and GaN based structures - 字舞流文

Study of dislocation EBIC image width in GaN films and GaN based structures

E. Yakimov | P. S. Vergeles

[1] E. Yakimov,et al. Electron-beam-induced-current study of defects in GaN; experiments and simulation , 2002 .

[2] A. Usikov,et al. High-resolution electron-beam-induced-current study of the defect structure in GaN epilayers , 2002 .