The role of stacking faults in the critical current density of MOD films through a thickness dependence study
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T. Puig | X. Obradors | J. Gázquez | N. Roma | B. Maiorov | F. Sandiumenge | J. Gutierrez | H. Wang
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T. Puig | X. Obradors | J. Gázquez | N. Roma | B. Maiorov | F. Sandiumenge | J. Gutierrez | H. Wang