XPS, XANES and ToF-SIMS Characterization of Reactively Magnetron-sputtered Carbon Nitride Films†
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Ming-Show Wong | W. Sproul | M. Wong | G. Tourillon | William D. Sproul | S. Lopez | Sébastien Lopez | H. M. Dunlop | M. Benmalek | Gérard Tourillon | M. Benmalek | H. Dunlop
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