The 2018 RADECS Workshop and 2nd International Conference on Radiation Effects of Electronic Devices (ICREED) were held on May 16–18, 2018, at the Fengda International Hotel, Beijing, China. The workshop and conference were hosted by the China Academy of Aerospace Electronics Technology, organized by the Beijing Microelectronics Technology Institute and the Harbin Institute of Technology, and attended by more than 260 researchers from 15 countries and more than 70 institutions. Six papers presented at ICREED are included in the June 2019 issue of the IEEE Transactions on Nuclear Science. These papers highlight active research on radiation effects on microelectronics in China. Additional papers based on work presented at ICREED appear in other issues of the transactions.