论文信息 - BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable? - 字舞流文

BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?

Rudy Lauwereins | Liesbet Van der Perre | Francky Catthoor | Guido Groeseneken | B. Kaczer | Praveen Raghavan | Pieter Weckx | Halil Kukner | D. Jang | D. Jang | B. Kaczer | F. Catthoor | L. Perre | R. Lauwereins | G. Groeseneken | P. Weckx | H. Kukner | P. Raghavan

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