论文信息 - Single Event Transient (SET) Susceptibility of the Texas Instruments LM139 Quad Comparator under Proton Irradiation - 字舞流文

Single Event Transient (SET) Susceptibility of the Texas Instruments LM139 Quad Comparator under Proton Irradiation

Proton Single Event Transient (SET) data are presented for the Texas Instruments (National Semiconductor) LM139AxQMLV (5962R9673801VxA).

Razvan Gaza | Jaime Cooper

[1] Sandeepan DasGupta,et al. Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator , 2009, 2009 IEEE Radiation Effects Data Workshop.

[2] S. Crain,et al. Variability in measured SEE sensitivity associated with design and fabrication iterations , 2003, 2003 IEEE Radiation Effects Data Workshop.