Getting Better Coverage from the Tests We Have

Rather than inventing a methodology for each problem, we could improve our application of existing tests. New procedures mean additional test costs, with many factors contributing to these expenses: design time and resource requirements, sacrificed area, extra ATE (Automatic Test Equipment) hardware and software for each test variation, and so on. Can the proven methods simply be altered to enhance the results and reduce costs? At the very least, this approach has the potential to stimulate new ideas in testing.

[1]  Anjali Kinra Towards reducing "functional only" fails for the UltraSPARC/sup TM/ microprocessors , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[2]  Edward J. McCluskey,et al.  Detecting delay flaws by very-low-voltage testing , 1996, Proceedings International Test Conference 1996. Test and Design Validity.