Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.

[1]  P. Staron,et al.  Neutrons and synchrotron radiation in engineering materials science : from fundamentals to applications , 2017 .

[2]  Philip Jackson,et al.  Effects of heavy alkali elements in Cu(In,Ga)Se2 solar cells with efficiencies up to 22.6% , 2016 .

[3]  A. Wilkinson,et al.  Microstrain distributions in polycrystalline thin films measured by X‐ray microdiffraction , 2016 .

[4]  R. Cook,et al.  Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si. , 2016, Ultramicroscopy.

[5]  D. Abou‐Ras,et al.  Orientation-distribution mapping of polycrystalline materials by Raman microspectroscopy , 2015, Scientific Reports.

[6]  A. Wilkinson,et al.  The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. , 2015, Ultramicroscopy.

[7]  G. Capellini,et al.  Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy , 2015 .

[8]  P. Boesecke,et al.  Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping , 2014 .

[9]  D. Abou‐Ras,et al.  Symmetry dependent optoelectronic properties of grain boundaries in polycrystalline Cu(In,Ga)Se2 thin films , 2014 .

[10]  R. Scheer,et al.  Electron-beam-induced current at absorber back surfaces of Cu(In,Ga)Se2 thin-film solar cells , 2014 .

[11]  A. Kirkland,et al.  Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment. , 2013, Ultramicroscopy.

[12]  H. Schock,et al.  Compositional Gradients in Cu(In,Ga)Se$_{\bf 2}$ Thin Films for Solar Cells and Their Effects on Structural Defects , 2012, IEEE Journal of Photovoltaics.

[13]  A. Wilkinson,et al.  High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations. , 2012, Ultramicroscopy.

[14]  A. Wilkinson,et al.  Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction. , 2011, Ultramicroscopy.

[15]  A. Wilkinson,et al.  Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. , 2010, Ultramicroscopy.

[16]  R. Klenk,et al.  Depth profiling of Cu(In,Ga)Se2 thin films grown at low temperatures , 2009 .

[17]  R. Scheer,et al.  Influence of grain boundaries on current collection in Cu(In,Ga)Se2 thin-film solar cells , 2009 .

[18]  R. Cook,et al.  Comparison of nanoscale measurements of strain and stress using electron back scattered diffraction and confocal Raman microscopy , 2008 .

[19]  J. Werner,et al.  Correlation of structure parameters of absorber layer with efficiency of Cu(In, Ga)Se2 solar cell , 2008 .

[20]  A. Schreyer.  Physical Properties of Photons and Neutrons , 2008 .

[21]  Walter Reimers,et al.  Introduction to Diffraction Methods for Internal Stress Analyses , 2008 .

[22]  H. Schock,et al.  Grain-size distributions and grain boundaries of chalcopyrite-type thin films , 2007 .

[23]  Carol Trager-Cowan,et al.  Many-beam dynamical simulation of electron backscatter diffraction patterns. , 2007, Ultramicroscopy.

[24]  Silke Christiansen,et al.  Grain orientation, texture, and internal stress optically evaluated by micro-Raman spectroscopy , 2007 .

[25]  G. Ice,et al.  White Beam Microdiffraction and Dislocations Gradients (Chapter 79) , 2007 .

[26]  David J. Dingley,et al.  High resolution mapping of strains and rotations using electron backscatter diffraction , 2006 .

[27]  N. Medvedeva,et al.  First-principles study of deformation behavior and structural defects in CuIn Se 2 and Cu (In,Ga) Se 2 , 2006 .

[28]  S. Wright,et al.  EBSD Image Quality Mapping , 2005, Microscopy and Microanalysis.

[29]  Armel Le Bail,et al.  Whole powder pattern decomposition methods and applications: A retrospection , 2005, Powder Diffraction.

[30]  K. Bertness,et al.  EBSD Measurement of strains in GaAs due to oxidation of buried AlGaAs layers , 2004 .

[31]  P. Schwander,et al.  Rotational twins in heteroepitaxial CuInSe2 layers on Si(111) , 1997 .

[32]  A. Wilkinson,et al.  Measurement of elastic strains and small lattice rotations using electron back scatter diffraction. , 1996, Ultramicroscopy.

[33]  日野 寛三,et al.  対数正規分布(Lognormal Distribution)のあてはめについて , 1994 .

[34]  T. Negami,et al.  Fivefold multiply twinned crystallites in CuInSe2 , 1994 .

[35]  Juan Rodríguez-Carvajal,et al.  Recent advances in magnetic structure determination by neutron powder diffraction , 1993 .

[36]  K. Troost,et al.  Microscale elastic‐strain determination by backscatter Kikuchi diffraction in the scanning electron microscope , 1993 .

[37]  Rincón,et al.  Pressure dependence of the Raman A1 mode and pressure-induced phase transition in CuInSe2. , 1992, Physical review. B, Condensed matter.

[38]  K. Knight.  The crystal structures of CuInSe2 and CuInTe2 , 1992 .

[39]  A. Rockett,et al.  A TEM study of the crystallography and defect structures of single crystal and polycrystalline copper indium diselenide , 1991 .

[40]  K. West,et al.  Determination of the Gaussian and Lorentzian content of experimental line shapes , 1974 .

[41]  J. Peyre,et al.  Linear combination of Lorentzian and Gaussian profiles to fit resonance spectra (Letter to the Editor) , 1972 .

[42]  J. Aitchison,et al.  The Lognormal Distribution. , 1958 .

[43]  Robert F. Cook,et al.  Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si. , 2015, Ultramicroscopy.

[44]  R. Scheer,et al.  Electron-beam-induced current at absorber back surfaces of Cu ( In , Ga ) Se 2 thin-film solar cells , 2014 .

[45]  Hisashi Muraoka,et al.  SEMICONDUCTOR MATERIALS :- , 2012 .

[46]  A. Wilkinson,et al.  Strain Mapping Using Electron Backscatter Diffraction , 2009 .

[47]  H. Schock,et al.  New Structural Investigations in the Cu 2 Se(S)-In 2 Se 3 (S)/Cu 2 Se(S)-Ga 2 Se 3 (S) Phase Diagrams , 2009 .

[48]  Norbert Esser,et al.  Optical properties of CuIn1−xGaxSe2 quaternary alloys for solar-energy conversion , 2008 .

[49]  G. Ice,et al.  Chapter 79 White Beam Microdiffraction and Dislocations Gradients , 2007 .

[50]  R. Birringer,et al.  Specification of microstructure and characterization by scattering techniques , 2000 .

[51]  Hari Singh Nalwa,et al.  Handbook of nanostructured materials and nanotechnology , 2000 .

[52]  H. Bunge.  2 – Orientation of Individual Crystallites , 1982 .