A stand-alone integrated excitation/extraction system for analog BIST applications
暂无分享,去创建一个
[1] Keith Lofstrom. Early capture for boundary scan timing measurements , 1996, Proceedings International Test Conference 1996. Test and Design Validity.
[2] Gordon W. Roberts,et al. A high speed and area efficient on-chip analog waveform extractor , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
[3] M. F. Tompsett,et al. A 10-b 15-MHz CMOS recycling two-step A/D converter , 1990 .
[4] Stephen K. Sunter,et al. A simplified polynomial-fitting algorithm for DAC and ADC BIST , 1997, Proceedings International Test Conference 1997.
[5] Gordon W. Roberts,et al. On-chip analog signal generation for mixed-signal built-in self-test , 1999 .
[6] T. R. Viswanathan,et al. Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends , 1997 .