Reliability of Sintered and Soldered High Power Chip Size Packages and Flip Chip LEDs

For automotive exterior lighting application high luminance light sources are required, i.e. high current density. The interconnect between LED and board needs to have a high thermo-mechanical fatigue resistance. Silver and copper sintering was investigated as a replacement for SnAgCu (SAC) solder joints. Sinter processes with and without pressure were applied. For process development and reliability investigation the interconnects were analyzed by X-Ray (area and homogeneity of interconnect) and transient thermal analysis TTA (integrity of joint between LED and board). For development of the sinter processes, as reference, also 1 mm2 thin film dies (TF-LEDs) were used. Silver sintering under pressure revealed as expected high thermal and mechanical performance. Pressureless Ag sintered joints showed not as good but promising results. Printing and drying conditions have a major impact on the quality of the sinter joint, in especially for the FC-LEDs. For the FC-LEDs best thermal resistance mean value of 8.5 K/W is observed for silver sintering under pressure and a mean shear strength of 64 MPa in comparison to the reference SAC solder (8.5 K/W and 68 MPa). For copper sintering no stable process was achieved. The main reason was due to only partial reduction (under formic acid enriched nitrogen) of the copper paste during the sintering process. The reliability of the soldered LED interconnects using different solders, i.e. SAC305, SnBiAg, Indium and an improved SAC+ solder, was investigated by accelerated stress testing. The LEDs are placed in a temperature shock chamber and the joint quality, i.e. crack formation, is measured after 100/500/750/1000 cycles by TTA. The degradation of the thermal properties of the joints is monitored. The reliability data are presented and discussed in the paper.

[1]  Gordon Elger,et al.  In-Situ measurements of the relative thermal resistance: Highly sensitive method to detect crack propagation in solder joints , 2014, 2014 IEEE 64th Electronic Components and Technology Conference (ECTC).

[2]  Gordon Elger,et al.  Transient thermal analysis for accelerated reliability testing of LEDs , 2016, Microelectron. Reliab..

[3]  Gordon Elger,et al.  Analysis of solder joint reliability of high power LEDs by transient thermal testing and transient finite element simulations , 2015, Microelectron. J..

[4]  Gordon Elger,et al.  Transient Thermal Analysis as a Test Method for the Reliability Investigation of High Power LEDs during Temperature Cycle Tests , 2013 .

[5]  G. Elger,et al.  New Method to Separate Failure Modes by Transient Thermal Analysis of High Power LEDs , 2017, 2017 IEEE 67th Electronic Components and Technology Conference (ECTC).

[6]  Guo-Quan Lu,et al.  Low-Temperature Sintered Nanoscale Silver as a Novel Semiconductor Device-Metallized Substrate Interconnect Material , 2006, IEEE Transactions on Components and Packaging Technologies.

[7]  Gordon Elger,et al.  Analysis of new direct on PCB board attached high power flip-chip LEDs , 2015, 2015 IEEE 65th Electronic Components and Technology Conference (ECTC).

[8]  R. Darveaux Effect of simulation methodology on solder joint crack growth correlation , 2000, 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070).

[9]  Tao Wang,et al.  Transient Thermal Performance of IGBT Power Modules Attached by Low-Temperature Sintered Nanosilver , 2012, IEEE Transactions on Device and Materials Reliability.

[10]  Gordon Elger,et al.  Detection of solder joint cracking of high power leds on AI-IMS during temperature shock test by transient thermal analysis , 2014, 20th International Workshop on Thermal Investigations of ICs and Systems.

[11]  Gordon Elger,et al.  The influence of the phosphor layer as heat source and up-stream thermal masses on the thermal characterization by transient thermal analysis of modern wafer level high power LEDs , 2016, Microelectron. Reliab..

[12]  Gordon Elger,et al.  The influence of voids in solder joints on thermal performance and reliability investigated with transient thermal analysis , 2015, 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).

[13]  Sabuj Mallik,et al.  Fatigue life of lead-free solder thermal interface materials at varying bond line thickness in microelectronics , 2014, Microelectron. Reliab..

[14]  Zhenxian Liang,et al.  Properties of Bulk Sintered Silver As a Function of Porosity , 2012 .

[15]  Gordon Elger,et al.  Transient thermal analysis as measurement method for IC package structural integrity , 2015 .

[16]  Gordon Elger,et al.  Thermogravimetric investigation on the interaction of formic acid with solder joint materials , 2016 .