Noise of the induced signal pulses in semiconductor drift detectors

The noise associated with the signal current at the anode of a semiconductor drift detector is evaluated when the electrostatic induction giving rise to the signal is fully taken into account and the correct boundary condition at the anode for the electron density is considered. The consequent signal-to-noise ratio for both time and amplitude measurements is calculated as a function of the filter width and compared with previous results based on more simplified treatments.