High-resolution non-invasive 3D imaging of paint microstructure by synchrotron-based X-ray laminography
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Joris Dik | Lukas Helfen | Tilo Baumbach | Arie Wallert | Peter Reischig | P. Reischig | T. Baumbach | L. Helfen | J. Dik | A. Wallert
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