Semiconductor device, and method for inputting and / or outputting test data

The invention relates to a semiconductor device (2a, 2b) and a method for inputting and / or outputting test data and / or semiconductor device operating control data into or out of a semiconductor device (2a, 2b) Semiconductor device (2a, 2b) has one or more user data memory cells (202a) for storing user data, and one or more test data and / or semiconductor device operation control data registers (102a) for storing test data and / or semiconductor device operation control data, and wherein the method comprises the steps of: DOLLAR A - (a) applying a control signal to the semiconductor device (2a, 2b) to switch the semiconductor device (2a, 2b) of a first into a second mode of operation; and DOLLAR A - (b) applying an address signal to the semiconductor device (2a, 2b), wherein in the second operating mode with the address signal one or more of the test data and / or semiconductor device operating Control data registers (102a) of the semiconductor device (2a, 2b) are addressed, and in the first operating mode, one or more of the payload data memory cells (202a).