Effective diagnostics through interval unloads in a BIST environment
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[1] Paul H. Bardell,et al. Self-Testing of Multichip Logic Modules , 1982, International Test Conference.
[2] Vinod K. Agarwal,et al. A diagnosis method using pseudo-random vectors without intermediate signatures , 1989, 1989 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.
[3] B. Koenemann. LFSR-coded test patterns for scan designs , 1991 .
[4] Vishwani D. Agrawal,et al. A Tutorial on Built-In Self-Test, Part 2: Applications , 1993, IEEE Des. Test Comput..
[5] Janusz Rajski,et al. Automated synthesis of large phase shifters for built-in self-test , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
[6] Nur A. Touba,et al. A rapid and scalable diagnosis scheme for BIST environments with a large number of scan chains , 2000, Proceedings 18th IEEE VLSI Test Symposium.
[7] Thomas W. Williams,et al. Design of compactors for signature-analyzers in built-in self-test , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).