The use of simulation in semiconductor technology development
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Jack A. Mandelman | T. D. Linton | Orest Bula | Massimo V. Fischetti | James A. Slinkman | E. M. Buturla | Steven E. Laux | Stephen S. Furkay | A. W. Strong | J. B. Johnson | Daniel C. Cole | P. E. Cottrell | D. P. Foty | K. Varahramyan | J. W. Park | H. G. Lustig | F. Pileggi | D. Katcoff | S. Laux | P. Cottrell | M. Fischetti | T. Linton | S. Furkay | O. Bula | D. Foty | J. Slinkman | K. Varahramyan | E. Buturla | J. Park | J. Mandelman | D. Cole | A. Strong | J. Johnson | D. Katcoff | F. Pileggi | H. Lustig
[1] Abraham,et al. Molecular-dynamics study of self-interstitials in silicon. , 1987, Physical review. B, Condensed matter.
[2] P. Ciampolini,et al. Numerical simulation of polycrystalline-Silicon MOSFET's , 1986, IEEE Transactions on Electron Devices.
[3] P. J. Price. The theory of hot electrons , 1970 .
[4] Nguyen Huy Xuong,et al. Mathematical 2-dimensional model of semiconductor devices , 1971 .
[5] P. Hohenberg,et al. Inhomogeneous Electron Gas , 1964 .
[6] A. S. Grove,et al. Redistribution of Acceptor and Donor Impurities during Thermal Oxidation of Silicon , 1964 .
[7] Roberto Guerrieri,et al. A new discretization strategy of the semiconductor equations comprising momentum and energy balance , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[8] Chiakang Sung,et al. A general simulator for VLSI lithography and etching processes: Part II—Application to deposition and etching , 1980, IEEE Transactions on Electron Devices.
[9] M. S. Mock,et al. Analysis of mathematical models of semiconductors devices , 1983 .
[10] A. Akiyama,et al. Computer Simulation of Impurity Diffusion in Semiconductors by the Monte Carlo Method , 1987, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[11] Paul Jespers,et al. Process and Device Modeling for Integrated Circuit Design , 1977 .
[12] S.A. Schwarz,et al. Semi-empirical equations for electron velocity in silicon: Part I—Bulk , 1983, IEEE Transactions on Electron Devices.
[13] W. L. Engl,et al. The influence of the thermal equilibrium approximation on the accuracy of classical two-dimensional numerical modeling of silicon submicrometer MOS transistors , 1988 .
[14] E. M. Buturla,et al. Simulation of semiconductor transport using coupled and decoupled solution techniques , 1980 .
[15] Richard B. Fair,et al. Effect of complex formation on diffusion of arsenic in silicon , 1973 .
[16] Rossi,et al. Quantum theory of transient transport in semiconductors: A Monte Carlo approach. , 1989, Physical review. B, Condensed matter.
[17] Mamoru Kurata,et al. Numerical analysis for semiconductor devices , 1982 .
[18] Siegfried Selberherr,et al. MINIMOS—A two-dimensional MOS transistor analyzer , 1980 .
[19] Jeffrey Frey,et al. AN EFFICIENT TECHNIQUE FOR TWO‐DIMENSIONAL SIMULATION OF VELOCITY OVERSHOOT EFFECTS IN Si AND GaAs DEVICES , 1982 .
[20] W. Kohn,et al. Self-Consistent Equations Including Exchange and Correlation Effects , 1965 .
[21] J. Lorenz,et al. COMPOSITE—A complete modeling program of silicon technology , 1985, IEEE Transactions on Electron Devices.
[22] Yaneer Bar-Yam,et al. Silicon self-interstitial migration: Multiple paths and charge states , 1984 .
[23] G. Jacucci,et al. Vacancy Double Jumps and Atomic Diffusion in Aluminum and Sodium , 1977 .
[24] Roger Clinton Evans,et al. Shaping geometric objects by cumulative translational sweeps , 1987 .
[25] Mark T. Robinson,et al. Computer simulation of atomic-displacement cascades in solids in the binary-collision approximation , 1974 .
[26] H. W. Loeb,et al. Application of 2-dimensional solutions of the Shockley-Poisson equation to inversion-layer m.o.s.t. devices , 1968 .
[27] Carey E. Floyd,et al. Two-dimensional impurity profiling with emission computed tomography techniques , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[28] Robert W. Dutton,et al. Plastic flow during thermal oxidation of silicon , 1989 .
[29] J.P. Kreskovsky. A hybrid central difference scheme for solid-state device simulation , 1987, IEEE Transactions on Electron Devices.
[30] C. Wilson. Hydrodynamic carrier transport in semiconductors with multiple band minima , 1988 .
[31] R. F. Lever,et al. Enhanced ‘‘tail’’ diffusion of phosphorus and boron in silicon: Self‐interstitial phenomena , 1986 .
[32] T. Nishida,et al. A physically based mobility model for MOSFET numerical simulation , 1987, IEEE Transactions on Electron Devices.
[33] V. L. Rideout,et al. Very small MOSFET's for low-temperature operation , 1977, IEEE Transactions on Electron Devices.
[34] Charles H. Bennett,et al. Molecular dynamics calculation of the isotope effect for vacancy diffusion , 1975 .
[35] A. Neureuther,et al. A general simulator for VLSI lithography and etching processes: Part I—Application to projection lithography , 1979, IEEE Transactions on Electron Devices.
[36] S. M. Hu,et al. Interactions in Sequential Diffusion Processes in Semiconductors , 1968 .
[37] Fumio Horiguchi,et al. Effects of a new trench-isolated transistor using sidewall gates , 1989 .
[38] S. Selberherr,et al. MINIMOS 3: A MOSFET simulator that includes energy balance , 1987, IEEE Transactions on Electron Devices.
[39] C. Jacoboni,et al. The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials , 1983 .
[40] Pandey. Diffusion without vacancies or interstitials: A new concerted exchange mechanism. , 1986, Physical review letters.
[41] W. V. Roosbroeck. Theory of the flow of electrons and holes in germanium and other semiconductors , 1950 .
[42] S. Laux,et al. Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects. , 1988, Physical review. B, Condensed matter.
[43] P. Griffin,et al. Point defects and dopant diffusion in silicon , 1989 .
[44] Robert G. Byrnes,et al. Semiconductor device simulation using generalized mobility models , 1985 .
[45] J. H. Weiner,et al. Rate theory for solids. IV. Classical Brownian-motion model , 1974 .
[46] David K. Brice,et al. Ion Implantation Range and Energy Deposition Distributions , 1975 .
[47] D. Hamann,et al. Norm-Conserving Pseudopotentials , 1979 .
[48] S. Laux,et al. Monte-Carlo simulation of submicrometer Si n-MOSFETs at 77 and 300 K , 1988, IEEE Electron Device Letters.
[49] R. R. O'Brien,et al. A field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices , 1981, IEEE Electron Device Letters.
[50] T. May,et al. Alpha-particle-induced soft errors in dynamic memories , 1979, IEEE Transactions on Electron Devices.
[51] Siegfried Selberherr,et al. Three-dimensional process and device modeling , 1989 .
[52] S. Selberherr. Analysis and simulation of semiconductor devices , 1984 .
[53] Donald J. Rose,et al. Numerical methods for the hydrodynamic device model: subsonic flow , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[54] H. Gummel,et al. Large-signal analysis of a silicon Read diode oscillator , 1969 .
[55] N. Shigyo,et al. Three-dimensional simulation of inverse narrow-channel effect , 1982 .
[56] D. P. Kennedy,et al. Calculations of impurity atom diffusion through a narrow diffusion mask opening , 1966 .
[57] S. M. Hu,et al. Thermal oxidation of silicon: Chemisorption and linear rate constant , 1984 .
[58] S. E. Laux. Techniques for small-signal analysis of semiconductor devices , 1985 .
[59] R. H. Dennard,et al. Alpha-particle-induced soft error rate in VLSI circuits , 1982 .
[60] Y.-K. Feng,et al. Simulation of submicrometer GaAs MESFET's using a full dynamic transport model , 1988 .
[61] D. P. Kennedy,et al. Steady state mathematical theory for the insulated gate field effect transistor , 1973 .
[62] F. Reif,et al. Fundamentals of Statistical and Thermal Physics , 1965 .
[63] Farid F. Abraham,et al. Computer simulations of surfaces, interfaces, and physisorbed films , 1984 .
[64] E. Tannenbaum,et al. Impurity redistribution and junction formation in silicon by thermal oxidation , 1960 .
[65] K. Taniguchi,et al. IMPACT—A point-defect-based two-dimensional process simulator: Modeling the lateral oxidation-enhanced diffusion of dopants in silicon , 1986, IEEE Transactions on Electron Devices.
[66] Peter J. Price,et al. Calculation of hot electron phenomena , 1978 .
[67] J. Slotboom. Iterative scheme for 1- and 2- dimensional d.c.-transistor simulation , 1969 .
[68] M.J. Hargrove,et al. Numerical solution of the semiconductor transport equations with current boundary conditions , 1983, IEEE Transactions on Electron Devices.
[69] K. Blotekjaer. Transport equations for electrons in two-valley semiconductors , 1970 .
[70] R.W. Dutton,et al. Process design using two-dimensional process and device simulators , 1982, IEEE Transactions on Electron Devices.
[71] A. Rothwarf. A new quantum mechanical channel mobility model for Si MOSFET's , 1987, IEEE Electron Device Letters.
[72] L. Borucki,et al. FEDSS: a 2D semiconductor fabrication process simulator , 1985 .
[73] S. Horiguchi,et al. A three-dimensional analysis of semiconductor devices , 1982, IEEE Transactions on Electron Devices.
[74] F. Stern,et al. Electronic properties of two-dimensional systems , 1982 .
[75] T. S. Low,et al. Dramatic reduction of sidegating in MODFETs , 1988 .
[76] Richard B. Fair,et al. Diffusion of ion-implanted B in high concentration P- and As-doped silicon , 1975 .
[77] R. Fair,et al. A Quantitative Model for the Diffusion of Phosphorus in Silicon and the Emitter Dip Effect , 1977 .
[78] E. M. Azoff. Generalized energy-momentum conservation equations in the relaxation time approximation , 1987 .
[79] B. Penumalli,et al. A comprehensive two-dimensional VLSI process simulation program, BICEPS , 1983, IEEE Transactions on Electron Devices.
[80] Wha Wil Schilders,et al. Semiconductor device modelling from the numerical point of view , 1987 .
[81] Steven E. Laux,et al. Electron states in narrow gate-induced channels in Si , 1986 .
[82] L. Reggiani. Recent results on hot-electron quantum transport☆ , 1985 .
[83] Dipen N. Sinha,et al. Transient Measurements of Ultrafast Charge Collection in Semicouductor Diodes , 1987, IEEE Transactions on Nuclear Science.
[84] Onno W. Purbo,et al. Numerical model for degenerate and heterostructure semiconductor devices , 1989 .
[85] Robert W. Dutton,et al. Verification of analytic point defect models using SUPREM-IV [dopant diffusion] , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[86] Massimo Vanzi,et al. A physically based mobility model for numerical simulation of nonplanar devices , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[87] William Joseph Fitzgerald,et al. Solid modeling for production design , 1987 .
[88] J. Biersack,et al. A Monte Carlo computer program for the transport of energetic ions in amorphous targets , 1980 .
[89] Charles H. Bennett,et al. Efficient estimation of free energy differences from Monte Carlo data , 1976 .
[90] S. Russek,et al. Semi-empirical equations for electron velocity in silicon: Part II—MOS inversion layer , 1983, IEEE Transactions on Electron Devices.
[91] Christian A. Ringhofer,et al. Implications of Analytical Investigations About the Semiconductor Equations on Device Modeling Programs , 1984, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[92] Michael A. Wesley,et al. OYSTER: A Study of Integrated Circuits as Three Dimensional Structures , 1983, IBM J. Res. Dev..
[93] G. C. Messenger,et al. Collection of Charge on Junction Nodes from Ion Tracks , 1982, IEEE Transactions on Nuclear Science.
[94] M. Lin,et al. A better understanding of the channel mobility of Si MOSFETs based on the physics of quantized subbands , 1988 .
[95] R. Stratton,et al. Diffusion of Hot and Cold Electrons in Semiconductor Barriers , 1962 .
[96] R. Dutton,et al. Models for computer simulation of complete IC fabrication process , 1979 .
[97] R. Dutton,et al. Coupled Monte Carlo-drift diffusion analysis of hot-electron effects in MOSFETs , 1989 .
[98] R.W. Dutton,et al. VLSI Process modeling—SUPREM III , 1983, IEEE Transactions on Electron Devices.
[99] A. B. Campbell,et al. Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodes , 1988 .
[100] Peter E. Cottrell,et al. Hot-electron emission in N-channel IGFET's , 1979 .
[101] William Shockley,et al. The theory of p-n junctions in semiconductors and p-n junction transistors , 1949, Bell Syst. Tech. J..
[102] A. S. Grove,et al. General Relationship for the Thermal Oxidation of Silicon , 1965 .
[103] E. M. Buturla,et al. Finite-element analysis of semiconductor devices: the FIELDAY program , 1981 .
[104] R.H. Dennard,et al. Design and experimental technology for 0.1-µm gate-length low-temperature operation FET's , 1987, IEEE Electron Device Letters.
[105] D. Critchlow,et al. A substrate-plate trench-capacitor (SPT) memory cell for dynamic RAM's , 1986 .
[106] P. Lugli,et al. The Monte Carlo Method for Semiconductor Device Simulation , 1990 .
[107] Hemantha K. Wickramasinghe,et al. Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy , 1989 .
[108] Kelly,et al. Microscopic theory of impurity-defect reactions and impurity diffusion in silicon. , 1985, Physical review letters.
[109] R W Hockney,et al. Computer Simulation Using Particles , 1966 .
[110] A. Tasch,et al. A new approach to verify and derive a transverse-field-dependent mobility model for electrons in MOS inversion layers , 1989 .
[111] Andrew R. Neureuther,et al. Characterization and modeling of materials for photolithographic simulation , 1990 .
[112] Tahir-Kheli. Monte Carlo evaluation of the diffusion correlation factor in concentrated lattices and comparison with an improved theory. , 1987, Physical review. B, Condensed matter.
[113] David P. Kennedy,et al. Analysis of the Impurity Atom Distribution Near the Diffusion Mask for a Planar p-n Junction , 1965, IBM J. Res. Dev..
[114] William Shockley,et al. Electrons and Holes in Semiconductors , 1952 .
[115] S. Bandyopadhyay,et al. A rigorous technique to couple Monte Carlo and drift-diffusion models for computationally efficient device simulation , 1987, IEEE Transactions on Electron Devices.
[116] Edward M. Buturla,et al. Animation and 3D Color Display of Multiple-Variable Data: Application to Semiconductor Design , 1985, IBM J. Res. Dev..
[117] B. J. Mulvaney,et al. Model for defect‐impurity pair diffusion in silicon , 1987 .
[118] M. Mock. A two-dimensional mathematical model of the insulated-gate field-effect transistor , 1973 .
[119] Steven G. Duvall,et al. An interchange format for process and device simulation , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[120] Richard B. Fair,et al. Low-thermal-budget process modeling with the PREDICT computer program , 1988 .
[121] J. Barker,et al. On the physics and modeling of small semiconductor devices—I , 1980 .
[122] Massimo Rudan,et al. Numerical solution of the hydrodynamic model for a one-dimensional semiconductor device , 1987 .
[123] Shinji Odanaka,et al. SMART-P: rigorous three-dimensional process simulator on a supercomputer , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[124] H. Gummel. A self-consistent iterative scheme for one-dimensional steady state transistor calculations , 1964 .
[125] Nichols,et al. Mechanisms of equilibrium and nonequilibrium diffusion of dopants in silicon. , 1989, Physical review letters.
[126] Roberto Car,et al. Microscopic theory of atomic diffusion mechanisms in silicon , 1984 .
[127] S. Laux,et al. The physics of hot-electron degradation of Si MOSFET's: Can we understand it? , 1989 .
[128] Peter A. Markowich,et al. The Stationary Semiconductor Device Equations. , 1987 .
[129] J. Bardeen,et al. Deformation Potentials and Mobilities in Non-Polar Crystals , 1950 .
[130] Massimo Rudan,et al. MULTI‐DIMENSIONAL DISCRETIZATION SCHEME FOR THE HYDRODYNAMIC MODEL OF SEMICONDUCTOR DEVICES , 1986 .
[131] E. M. Azoff. Energy transport numerical simulation of graded AlGaAs/GaAs heterojunction bipolar transistors , 1989 .
[132] R. S. Muller,et al. IGFET Analysis through numerical solution of Poisson's equation , 1968 .
[133] R. Bate. The quantum-effect device: Tomorrow's transistors , 1988 .
[134] R. R. O'Brien,et al. Two-dimensional mathematical analysis of a planar type junction field-effect transistor , 1969 .
[135] Marius K. Orlowski. Unified model for impurity diffusion in silicon , 1988 .
[136] S. E. Laux,et al. A general control-volume formulation for modeling impact ionization in semiconductor transport , 1985 .
[137] H. H. Hansen,et al. FEDSS—Finite-element diffusion-simulation system , 1983, IEEE Transactions on Electron Devices.
[138] K. Lehovec,et al. Diffusion of charged particles into a semiconductor under consideration of the built-in field , 1961 .