Nano-size defect layers in arsenic-implanted and annealed HgCdTe epitaxial films studied with transmission electron microscopy
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I. Izhnin | O. I. Fitsych | A. Voitsekhovskii | K. Mynbaev | M. Yakushev | D. Marin | J. Morgiel | N. Mikhailov | R. Jakieła | I. Syvorotka | H. Savytskyy | V. S. Varavin | A. Korotaev | O. Bonchyk | Z. Swiatek